Shi, Hong2015-05-122015-05-121998https://scholarworks.montana.edu/handle/1/7728enCandida albicansTime-of-flight mass spectrometrySecondary ion mass spectrometryAn exploration of the utility of TOF-SIMS as a new method for studying the cell surface of Candida albicansThesisCopyright 1998 by Hong Shi