Tu, Chi-ShunChien, R.R.Schmidt, V. HugoWang, F.-T.Hsu, W.-T.Tseng, C.-T.Shih, C.C.2016-12-072016-12-072005C.-S. Tu, R.R. Chien, V.H. Schmidt, F.-T. Wang, W.-T. Hsu, C.-T. Tseng, and C.C. Shih, “Dielectric/piezoelectric resonance in high-strain Pb(Mg1/3Nb2/3)1-xTixO3 crystals,” J. Appl. Phys. 97, 126105 (2005).0021-8979https://scholarworks.montana.edu/handle/1/12337This work presents dielectricresonance in Pb(Mg1∕3Nb2∕3)1−xTixO3 crystals after electric (E)-field poling, which is crucial for piezoelectric applications. Dielectricpermittivity has been measured as functions of temperature, frequency, poling E-field strength, and Ti content (x=25% and 34%). Frequency-dependent dielectric spectroscopy after poling exhibits multiple piezoelectricresonances between 0.2 and 1MHz, and can be described by the forced-damped-oscillator model. The resonantspectra show significant changes while phase transitions are taking place.en-USDielectric/piezoelectric resonance in high-strain Pb(Mg1/3Nb2/3)1-xTixO3 crystalsArticle