Quantitative determination of the structures of Bi and Sb thin films grown on Si(lll) and Ge(lll) surfaces

Wan, Kejia2015-05-122015-05-121991https://scholarworks.montana.edu/handle/1/6601enThin filmsSemiconductor-metal boundariesLow energy electron diffractionQuantitative determination of the structures of Bi and Sb thin films grown on Si(lll) and Ge(lll) surfacesDissertationCopyright 1991 by Kejia Wan