Lanceros-Mendez, S.Moreira, S. C.Mano, J. F.Schmidt, V. HugoBohannan, Gary W.2019-02-042019-02-042002S. Lanceros-Mendez, M.V. Moreira, J.F. Mano, V.H. Schmidt, and G. Bohannan, “Dielectric behavior in an oriented β-PVDF film and chain reorientation upon transverse mechanical deformation,” Ferroelectrics 273, 15-20 (2002). doi: 10.1080/001501902117560015-0193https://scholarworks.montana.edu/handle/1/15207Films of semicrystalline poly(vinylidene fluoride) (PVDF) in the g -phase have been studied by means of dielectric measurements and Fourier Transform Infrared Spectroscopy (FTIR). The main goal of the study was to compare the dielectric relaxations of f - and g -PVDF and to improve the understanding of the structural changes that occur in g -PVDF during a mechanical deformation process and their impact in the electromechanical properties of the polymer. A reorientation of the chains and a decrease in the degree of crystallinity with increasing deformation was observed.enThis Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).http://rightsstatements.org/vocab/InC/1.0/Dielectric behavior in an oriented β-PVDF film and chain reorientation upon transverse mechanical deformationArticle