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dc.contributor.authorWalls, Kelly
dc.date.accessioned2017-06-05T16:49:05Z
dc.date.available2017-06-05T16:49:05Z
dc.date.issued2017-04
dc.identifier.urihttps://scholarworks.montana.edu/xmlui/handle/1/12959
dc.description.abstractMaterials characterization allows for a better understanding of the relationships among the processing, structure, properties and performance of advanced materials and is vital in industrial research and development. Modern industries rely on several surface analysis techniques, including scanning electron microscopy (SEM), energy-dispersive x-ray spectroscopy (EDS), x-ray photoelectron spectroscopy (XPS), and x-ray diffraction (XRD). Each surface analysis technique has unique functionalities, capabilities, advantages and limitations. In this presentation, the function and operation of SEM/EDS, XPS, and XRD will be discussed alongside examples of their use in high-tech materials research and development.en_US
dc.language.isoen_USen_US
dc.publisherMontana State Univeristyen_US
dc.titleSurface Characterization Techniques in Materials Research and Developmenten_US
dc.typePresentationen_US
mus.citation.conferenceStudent Research Celebrationen_US
mus.citation.extentfirstpage1en_US
mus.citation.extentlastpage1en_US
mus.relation.collegeCollege of Engineeringen_US
mus.relation.departmentMechanical & Industrial Engineering.en_US
mus.relation.universityMontana State University - Bozemanen_US


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