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dc.contributor.authorBakke, Rune
dc.contributor.authorOlsson, P. Q.
dc.date.accessioned2017-07-20T22:34:13Z
dc.date.available2017-07-20T22:34:13Z
dc.date.issued1986-07
dc.identifier.citationBakke R, Olsson PQ, "Biofilm thickness measurements by light microscopy," Journal of Microbiological Methods 1986 5(2):93-98en_US
dc.identifier.issn0167-7012
dc.identifier.urihttps://scholarworks.montana.edu/xmlui/handle/1/13403
dc.description.abstractLight microscopy has been used to measure biofilm thickness. The vertical displacement of the sample required to focus from the biofilm-liquid interface to the biofilm-substratum interface is measured by the stage micrometer. Biofilm thickness is proportional, but not equal, to the measured vertical displacement. An expression for the proportionality constant, kf, in terms of refractive indices is determined from a geometric analysis of the light path. kf can be estimated as the ratio of the refractive index of the film to the refractive index of the media interfacing the film between the objective lens and the sample. The thickness of any transparent film may be determined by light microscopy when the refractive index of the film is known.en_US
dc.titleBiofilm thickness measurements by light microscopyen_US
dc.typeArticleen_US
mus.citation.extentfirstpage93en_US
mus.citation.extentlastpage98en_US
mus.citation.issue2en_US
mus.citation.journaltitleJournal of Microbiological Methodsen_US
mus.citation.volume5en_US
mus.identifier.categoryEngineering & Computer Scienceen_US
mus.identifier.doi10.1016/0167-7012(86)90005-9en_US
mus.relation.collegeCollege of Engineeringen_US
mus.relation.departmentCenter for Biofilm Engineering.en_US
mus.relation.departmentChemical & Biological Engineering.en_US
mus.relation.departmentChemical Engineering.en_US
mus.relation.universityMontana State University - Bozemanen_US
mus.relation.researchgroupCenter for Biofilm Engineering.en_US
mus.data.thumbpage3en_US


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