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dc.contributor.authorBremer, Philip J.
dc.contributor.authorGeesey, Gill G.
dc.contributor.authorDrake, B.
dc.identifier.citationBremer, P.J., G.G. Geesey, and B. Drake, "Atomic Force Microscopy Examination of the Topography of a Hydrated Bacterial Biofilm on a Copper Surface," Current Microbiology, 24(4):223-230 (1992).en_US
dc.description.abstractA bacterium, designated CCI#8, that was isolated from a corroded copper coupon colonized both polished and unpolished copper surfaces under batch culture conditions. Atomic Force Microscopy (AFM) images revealed that the biofilm was heterogeneous in nature, both in depth and in cell distribution. Bacterial cells were shown to be associated with pits on the surface of the unpolished copper coupons. These observations support previous studies that CCI#8 is associated with the pitting corrosion of copper.en_US
dc.titleAtomic force microscopy examination of the topography of a hydrated bacterial biofilm on a copper surfaceen_US
mus.citation.journaltitleCurrent Microbiologyen_US
mus.identifier.categoryEngineering & Computer Scienceen_US
mus.relation.collegeCollege of Engineeringen_US
mus.relation.departmentCenter for Biofilm Engineering.en_US
mus.relation.departmentChemical & Biological Engineering.en_US
mus.relation.departmentChemical Engineering.en_US
mus.relation.universityMontana State University - Bozemanen_US
mus.relation.researchgroupCenter for Biofilm Engineering.en_US

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