Dielectric behavior in an oriented β-PVDF film and chain reorientation upon transverse mechanical deformation
Moreira, S. C.
Mano, J. F.
Schmidt, V. Hugo
Bohannan, Gary W.
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Films of semicrystalline poly(vinylidene fluoride) (PVDF) in the g -phase have been studied by means of dielectric measurements and Fourier Transform Infrared Spectroscopy (FTIR). The main goal of the study was to compare the dielectric relaxations of f - and g -PVDF and to improve the understanding of the structural changes that occur in g -PVDF during a mechanical deformation process and their impact in the electromechanical properties of the polymer. A reorientation of the chains and a decrease in the degree of crystallinity with increasing deformation was observed.
S. Lanceros-Mendez, M.V. Moreira, J.F. Mano, V.H. Schmidt, and G. Bohannan, “Dielectric behavior in an oriented β-PVDF film and chain reorientation upon transverse mechanical deformation,” Ferroelectrics 273, 15-20 (2002). doi: 10.1080/00150190211756