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dc.contributor.authorField, Nathaniel J.
dc.contributor.authorBrown, Jarrod P.
dc.contributor.authorCard, Darrel B.
dc.contributor.authorWelsh, Chad M.
dc.contributor.authorVan Rynbach, Andre J.
dc.contributor.authorShaw, Joseph A.
dc.identifier.citationNathaniel J. Field, Jarrod P. Brown, Darrel B. Card, Chad M. Welsh, Andre J. Van Rynbach, Joseph A. Shaw, "Gray Spectralon polarized reflectance deviations from Lambertian," Proc. SPIE 12112, Polarization: Measurement, Analysis, and Remote Sensing XV, 121120A (3 June 2022); doi: 10.1117/12.2618868en_US
dc.descriptionCopyright SPIE 2022en_US
dc.description.abstractWhile Spectralon panels are largely assumed to be ideal Lambertian surfaces, their actual polarized reflective responses deviate from the ideal by at least a small amount at illumination and viewing angles off surface normal. The Mueller matrix response of four different panels between 10% and 99% reflectance were measured and the radiometric response from two distinct monostatic or nearmonostatic polarimeter systems are compared, one at Montana State University and one at the Air Force Research Lab. The deviations from an assumed ideal Lambertian surface are reported.en_US
dc.rightscopyright SPIE 2022en_US
dc.subjectgray spectralonen_US
dc.subjectpolarized reflectanceen_US
dc.titleGray Spectralon polarized reflectance deviations from Lambertianen_US
mus.citation.journaltitlePolarization: Measurement, Analysis, and Remote Sensing XVen_US
mus.relation.collegeCollege of Engineeringen_US
mus.relation.departmentComputer Science.en_US
mus.relation.universityMontana State University - Bozemanen_US

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