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dc.contributor.authorLantz, Scott Lenen
dc.date.accessioned2015-05-12T20:45:15Z
dc.date.available2015-05-12T20:45:15Z
dc.date.issued1990en_US
dc.identifier.urihttps://scholarworks.montana.edu/xmlui/handle/1/6525en_US
dc.language.isoengen
dc.publisherMontana State University - Bozeman, College of Letters & Scienceen
dc.subject.lcshSemiconductors Surfaces.en
dc.subject.lcshSemiconductor-metal boundaries.en
dc.subject.lcshBismuth.en
dc.subject.lcshAtomic structure.en
dc.subject.lcshElectronic structure.en
dc.titleThe preparation and characterization of bismuth thin films on GaSb(110) using low energy electron diffractionen
dc.typeThesisen
dc.rights.holderCopyright Scott Len Lantz 1990en
thesis.catalog.ckey57902en
thesis.degree.departmentPhysics.en
thesis.degree.genreThesisen
thesis.degree.nameMSen
thesis.format.extentfirstpage1en
thesis.format.extentlastpage86en


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