Show simple item record

dc.contributor.authorWan, Kejiaen
dc.date.accessioned2015-05-12T20:42:07Z
dc.date.available2015-05-12T20:42:07Z
dc.date.issued1991en
dc.identifier.urihttps://scholarworks.montana.edu/xmlui/handle/1/6601en
dc.language.isoenen
dc.publisherMontana State University - Bozeman, College of Letters & Scienceen
dc.subject.lcshThin filmsen
dc.subject.lcshSemiconductor-metal boundariesen
dc.subject.lcshLow energy electron diffractionen
dc.titleQuantitative determination of the structures of Bi and Sb thin films grown on Si(lll) and Ge(lll) surfacesen
dc.typeDissertationen
dc.rights.holderCopyright 1991 by Kejia Wanen
thesis.catalog.ckey203035en
thesis.degree.departmentPhysics.en
thesis.degree.genreDissertationen
thesis.degree.namePhDen
thesis.format.extentfirstpage1en
thesis.format.extentlastpage138en


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record


MSU uses DSpace software, copyright © 2002-2017  Duraspace. For library collections that are not accessible, we are committed to providing reasonable accommodations and timely access to users with disabilities. For assistance, please submit an accessibility request for library material.