Show simple item record

dc.contributor.authorShi, Hongen
dc.date.accessioned2015-05-12T20:39:21Z
dc.date.available2015-05-12T20:39:21Z
dc.date.issued1998en
dc.identifier.urihttps://scholarworks.montana.edu/xmlui/handle/1/7728en
dc.language.isoenen
dc.publisherMontana State University - Bozeman, College of Engineeringen
dc.subject.lcshCandida albicansen
dc.subject.lcshTime-of-flight mass spectrometryen
dc.subject.lcshSecondary ion mass spectrometryen
dc.titleAn exploration of the utility of TOF-SIMS as a new method for studying the cell surface of Candida albicansen
dc.typeThesisen
dc.rights.holderCopyright 1998 by Hong Shien
thesis.catalog.ckey713325en
thesis.degree.departmentChemical & Biological Engineering.en
thesis.degree.genreThesisen
thesis.degree.nameMSen
thesis.format.extentfirstpage1en
thesis.format.extentlastpage179en


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record


MSU uses DSpace software, copyright © 2002-2017  Duraspace. For library collections that are not accessible, we are committed to providing reasonable accommodations and timely access to users with disabilities. For assistance, please submit an accessibility request for library material.