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dc.contributor.authorHunt, Stephen Michaelen
dc.date.accessioned2015-05-12T20:35:46Z
dc.date.available2015-05-12T20:35:46Z
dc.date.issued2000en_US
dc.identifier.urihttps://scholarworks.montana.edu/xmlui/handle/1/7967en_US
dc.language.isoengen
dc.publisherMontana State University - Bozeman, College of Engineeringen
dc.subject.lcshX-ray spectroscopy.en
dc.titleDepth profiling using XPSen
dc.typeThesisen
dc.rights.holderCopyright Stephen Michael Hunt 2000en
thesis.catalog.ckey793982en
thesis.degree.departmentChemical & Biological Engineering.en
thesis.degree.genreThesisen
thesis.degree.nameMSen
thesis.format.extentfirstpage1en
thesis.format.extentlastpage179en


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