Dielectric Relaxation Mechanism for Proton Glass
Schmidt, V. Hugo
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Dielectric relaxation of proton glasses is controlled by 0-H…0 proton intrabond hopping responsible for ‘Takagi’ HPO4 and H3PO4 intrinsic defect diffusion. The diffusion path has a one-dimensional fractal topology. The defects diffuse in a potential which also has a fractal nature, giving a barrier height distribution leading to a wide spread in dielectric relaxation times at low temperature. Expressions for dielectric relaxation and ac susceptibility are derived, and their fit to experimental results is briefly discussed.
Schmidt, V. Hugo. “Dielectric Relaxation Mechanism for Proton Glass.” Ferroelectrics 78, no. 1 (February 1988): 207–214. doi:10.1080/00150198808215907.