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dc.contributor.authorSchmidt, V. Hugo
dc.date.accessioned2016-04-15T17:14:19Z
dc.date.available2016-04-15T17:14:19Z
dc.date.issued1988-02-01
dc.identifier.citationSchmidt, V. Hugo. “Dielectric Relaxation Mechanism for Proton Glass.” Ferroelectrics 78, no. 1 (February 1988): 207–214. doi:10.1080/00150198808215907.en_US
dc.identifier.issn0015-0193
dc.identifier.urihttps://scholarworks.montana.edu/xmlui/handle/1/9688
dc.description.abstractDielectric relaxation of proton glasses is controlled by 0-H…0 proton intrabond hopping responsible for ‘Takagi’ HPO4 and H3PO4 intrinsic defect diffusion. The diffusion path has a one-dimensional fractal topology. The defects diffuse in a potential which also has a fractal nature, giving a barrier height distribution leading to a wide spread in dielectric relaxation times at low temperature. Expressions for dielectric relaxation and ac susceptibility are derived, and their fit to experimental results is briefly discussed.en_US
dc.titleDielectric Relaxation Mechanism for Proton Glassen_US
dc.typeArticleen_US
mus.citation.extentfirstpage207en_US
mus.citation.extentlastpage214en_US
mus.citation.issue1en_US
mus.citation.journaltitleFerroelectricsen_US
mus.citation.volume78en_US
mus.identifier.categoryChemical & Material Sciencesen_US
mus.identifier.categoryPhysics & Mathematicsen_US
mus.identifier.doi10.1080/00150198808215907en_US
mus.relation.collegeCollege of Letters & Scienceen_US
mus.relation.departmentPhysics.en_US
mus.relation.universityMontana State University - Bozemanen_US
mus.data.thumbpage5en_US


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