The preparation and characterization of bismuth thin films on GaSb(110) using low energy electron diffraction

dc.contributor.authorLantz, Scott Lenen
dc.date.accessioned2015-05-12T20:45:15Z
dc.date.available2015-05-12T20:45:15Z
dc.date.issued1990en
dc.identifier.urihttps://scholarworks.montana.edu/handle/1/6525en
dc.language.isoenen
dc.publisherMontana State University - Bozeman, College of Letters & Scienceen
dc.rights.holderCopyright 1990 by Scott Len Lantzen
dc.subject.lcshSemiconductors--Surfacesen
dc.subject.lcshSemiconductor-metal boundariesen
dc.subject.lcshBismuthen
dc.subject.lcshAtomic structureen
dc.subject.lcshElectronic structureen
dc.titleThe preparation and characterization of bismuth thin films on GaSb(110) using low energy electron diffractionen
dc.typeThesisen
thesis.catalog.ckey57902en
thesis.degree.departmentPhysics.en
thesis.degree.genreThesisen
thesis.degree.nameMSen
thesis.format.extentfirstpage1en
thesis.format.extentlastpage86en

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