Depth profiling using XPS
| dc.contributor.author | Hunt, Stephen Michael | en |
| dc.date.accessioned | 2015-05-12T20:35:46Z | |
| dc.date.available | 2015-05-12T20:35:46Z | |
| dc.date.issued | 2000 | en |
| dc.identifier.uri | https://scholarworks.montana.edu/handle/1/7967 | en |
| dc.language.iso | en | en |
| dc.publisher | Montana State University - Bozeman, College of Engineering | en |
| dc.rights.holder | Copyright 2000 by Stephen Michael Hunt | en |
| dc.subject.lcsh | X-ray spectroscopy | en |
| dc.title | Depth profiling using XPS | en |
| dc.type | Thesis | en |
| thesis.catalog.ckey | 793982 | en |
| thesis.degree.department | Chemical & Biological Engineering. | en |
| thesis.degree.genre | Thesis | en |
| thesis.degree.name | MS | en |
| thesis.format.extentfirstpage | 1 | en |
| thesis.format.extentlastpage | 179 | en |
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