Quantitative determination of the structures of Bi and Sb thin films grown on Si(lll) and Ge(lll) surfaces

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dc.contributor.authorWan, Kejiaen
dc.date.accessioned2015-05-12T20:42:07Z
dc.date.available2015-05-12T20:42:07Z
dc.date.issued1991en
dc.identifier.urihttps://scholarworks.montana.edu/handle/1/6601en
dc.language.isoenen
dc.publisherMontana State University - Bozeman, College of Letters & Scienceen
dc.rights.holderCopyright 1991 by Kejia Wanen
dc.subject.lcshThin filmsen
dc.subject.lcshSemiconductor-metal boundariesen
dc.subject.lcshLow energy electron diffractionen
dc.titleQuantitative determination of the structures of Bi and Sb thin films grown on Si(lll) and Ge(lll) surfacesen
dc.typeDissertationen
thesis.catalog.ckey203035en
thesis.degree.departmentPhysics.en
thesis.degree.genreDissertationen
thesis.degree.namePhDen
thesis.format.extentfirstpage1en
thesis.format.extentlastpage138en

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