Publications by Colleges and Departments (MSU - Bozeman)
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Item Toward polarization-enhanced water quality remote sensing measurements from UAVs(SPIE, 2024-05) Morgan, P. Flint; Weller, Wyatt W.; Maxwell, Dylan J.; Hamp, Shannon M.; Venkatesulu, Erica; Shaw, Joseph A.; Whitaker, Bradley M.; Roddewig, Michael R.Montana and similar regions contain numerous rivers and lakes that are too small to be spatially resolved by satellites that provide water quality estimates. Unoccupied Aerial Vehicles (UAVs) can be used to obtain such data with much higher spatial and temporal resolution. Water properties are traditionally retrieved from passively measured spectral radiance, but polarization has been shown to improve retrievals of the attenuation-to-absorption ratio to enable calculation of the scattering coefficient for in-water particulate matter. This feeds into improved retrievals of other parameters such as the bulk refractive index and particle size distribution. This presentation will describe experiments conducted to develop a data set for water remote sensing using combined UAV-based hyperspectral and polarization cameras supplemented with in-situ sampling at Flathead Lake in northwestern Montana and the results of preliminary data analysis. A symbolic regression model was used to derive two equations: one relating DoLP, AoP, and the linear Stokes parameters at wavelengths of 440 nm, 550 nm and 660 nm, to chlorophyll-a content, and one relating the same data to the attenuation-to-absorption ratio for 440 nm, 550 nm and 660 nm. Symbolic regression is a machine learning algorithm where the inputs are vectors and the output is an analytic expression, typically chosen by a genetic algorithm. An advantage of this approach is that the explainability of a simple equation can be combined with the accuracy of less explainable models, such as the genetic algorithm.Item Optical transmittance of 3D printing materials(Optica Publishing Group, 2021-07) Hamp, Shannon M.; Logan, Riley D.; Shaw, Joseph A.The increasing prevalence of three-dimensional (3D) printing of optical housings and mounts necessitates a better understanding of the optical properties of printing materials. This paper describes a method for using multithickness samples of 3D printing materials to measure transmittance spectra at wavelengths from 400 to 2400 nm [visible to short-wave infrared (IR)]. In this method, 3D samples with material thicknesses of 1, 2, 3, and 4 mm were positioned in front of a uniform light source with a spectrometer probe on the opposing side to measure the light transmittance. Transmission depended primarily on the thickness and color of the sample, and multiple scattering prevented the use of a simple exponential model to relate transmittance, extinction, and thickness. A Solidworks file and a 3D printer file are included with the paper to enable measurements of additional materials with the same method.