Dielectric Relaxation Mechanism for Proton Glass

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Date

1988-02-01

Authors

Schmidt, V. Hugo

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Abstract

Dielectric relaxation of proton glasses is controlled by 0-H…0 proton intrabond hopping responsible for ‘Takagi’ HPO4 and H3PO4 intrinsic defect diffusion. The diffusion path has a one-dimensional fractal topology. The defects diffuse in a potential which also has a fractal nature, giving a barrier height distribution leading to a wide spread in dielectric relaxation times at low temperature. Expressions for dielectric relaxation and ac susceptibility are derived, and their fit to experimental results is briefly discussed.

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Citation

Schmidt, V. Hugo. “Dielectric Relaxation Mechanism for Proton Glass.” Ferroelectrics 78, no. 1 (February 1988): 207–214. doi:10.1080/00150198808215907.
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